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Error Analysis of CM Data Products Sources of Uncertainty 科技报告
报告编号: SAND2017--1289R. 出版年: 2017
作者:  Hunt, Brian D. [Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)];  Eckert-Gallup, Aubrey Celia [Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)];  Cochran, Lainy Dromgoole [Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)];  Kraus, Terrence D. [Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)];  Allen, Mark B. [Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)];  Beal, Bill [National Security Technologies, Joint Base Andrews, MD (United States)];  Okada, Colin [National Security Technologies, LLC. (NSTec), Las Vegas, NV (United States)];  Simpson, Mathew [Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)]
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