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Investigation of degradation observed on recent polycrystalline silicon PV modules installed in desert region
John, Jim Joseph; Elnosh, Ammar; Safieh, Ahmad; Alnuaimi, Aaesha
通讯作者John, JJ (corresponding author), Dubai Elect & Water Author DEWA, Res & Dev Ctr, Dubai, U Arab Emirates.
会议名称IEEE 46th Photovoltaic Specialists Conference (PVSC)
会议日期JUN 16-21, 2019
会议地点Chicago, IL
英文摘要Reliability and durability of PV modules installed recently, especially in the desert regions, are unclear because they have been in operation for a short period. In this paper, we investigated the degradation of four types of polycrystalline silicon modules from different manufacturer installed in desert climatic conditions of Dubai. For each type, the annual degradation rate was calculated using indoor IV curves measured under STC conditions before installation and after more than 3 years of operation in the field. Eight out of the 16 PV modules installed in the field during the year 2015 showed acceptable degradation rate of less than 0.8%/yr. The PV panels made by Manufacturer, A-gb showed promising results with 3 out of their 4 modules showing less than 0.2%/yr in the field. Modules from Manufacturer, D-gg showed higher Pmax degradation due to optical losses, resulting from abrasion of sand.
英文关键词solar panels photovoltaic degradation current-voltage characteristics electroluminescence
来源出版物2019 IEEE 46TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC)
ISSN0160-8371
出版年2019
页码870-873
ISBN978-1-7281-0494-2
出版者IEEE
类型Proceedings Paper
语种英语
收录类别CPCI-S
WOS记录号WOS:000542034900179
WOS类目Energy & Fuels ; Engineering, Electrical & Electronic
WOS研究方向Energy & Fuels ; Engineering
资源类型会议论文
条目标识符http://119.78.100.177/qdio/handle/2XILL650/370066
作者单位[John, Jim Joseph; Elnosh, Ammar; Safieh, Ahmad; Alnuaimi, Aaesha] Dubai Elect & Water Author DEWA, Res & Dev Ctr, Dubai, U Arab Emirates
推荐引用方式
GB/T 7714
John, Jim Joseph,Elnosh, Ammar,Safieh, Ahmad,et al. Investigation of degradation observed on recent polycrystalline silicon PV modules installed in desert region[C]:IEEE,2019:870-873.
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