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	Automated nets extraction for digital logic physical failure analysis on IP-secure products
	Ngow, Y. T.; Goh, S. H.; Leo, J.; Low, H. W.; Kamoji, Rupa
通讯作者	Ngow, YT (corresponding author), GLOBALFOUNDRIES, Yield Diagnost Engn, Singapore, Singapore.
会议名称	IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
会议日期	JUL 20-23, 2020
会议地点	Singapore, SINGAPORE
英文摘要	GDSII layouts of IP-confidential products are heavily controlled and access is only granted to certain privileged personnel. Failure analysts are generally excluded. Without guidance from GDSII, failure analysis, specifically physical inspection based on fault isolation findings cannot proceed. To overcome this challenge, we develop an automated approach that enables image snapshots relevant to failure analysts to be furnished without compromising the confidentiality of the GDSII content in this paper. Modules built are executed to trace the suspected nets and extract them into multiple images of different pre-defined frame specifications to facilitate failure analysis.
英文关键词	Graphic Database System (GDSII) Open Artwork System Interchange Standard (OASIS) Scan Diagnosis User-Defined Online Search (UDOS) Tool Command Language (TCL) KDB (Conversion of GDSII information in to Synopsys Avalon Database) KTMask Command (Program to send commands to the Synopsys Avalon MaskView tool)
来源出版物	2020 IEEE INTERNATIONAL SYMPOSIUM ON THE PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS (IPFA)
ISSN	1946-1550
出版年	2020
出版者	IEEE
类型	Proceedings Paper
语种	英语
收录类别	CPCI-S
WOS记录号	WOS:000635636600020
WOS类目	Engineering, Electrical & Electronic
WOS研究方向	Engineering
资源类型	会议论文
条目标识符	http://119.78.100.177/qdio/handle/2XILL650/353067
作者单位	[Ngow, Y. T.; Goh, S. H.; Leo, J.] GLOBALFOUNDRIES, Yield Diagnost Engn, Singapore, Singapore; [Low, H. W.; Kamoji, Rupa] SYNOPSYS, Applicat Support, Singapore, Singapore
推荐引用方式 GB/T 7714	Ngow, Y. T.,Goh, S. H.,Leo, J.,et al. Automated nets extraction for digital logic physical failure analysis on IP-secure products[C]:IEEE,2020.