干旱区生态环境知识资源中心(Arid): Indoor characterisation of thin-film PV modules installed for 4.6 years in desert conditions

Arid

	Indoor characterisation of thin-film PV modules installed for 4.6 years in desert conditions
	Alheloo, Ahmad; John, Jim Joseph; Albadwawi, Omar; Almheiri, Ali; Alhamadani, Hebatalla; Hassan, Shaikha; Alnuaimi, Aaesha
通讯作者	Alheloo, A (corresponding author), Dubai Elect & Water Author DEWA, Res & Dev Ctr, Dubai, U Arab Emirates.
会议名称	47th IEEE Photovoltaic Specialists Conference (PVSC)
会议日期	JUN 15-AUG 21, 2020
会议地点	ELECTR NETWORK
英文摘要	Degradation of commercially available CdTe and CIGS PV modules installed in the desert conditions, are not well understood, because they have been in operation for relatively short period compared to crystalline silicon PV technology. In this paper, we investigate the degradation rate of both these thin-film technologies using indoor characterization methods. The calculated annual degradation rate of CdTe technology (1.3-2.2 percent/year) is lower than CIGS (5.3-8.8 /year). The main cause of this degradation is the reduction in fill factor caused by formation of permanent shunts. These shunts were characterized using Electroluminescence and microscopic imaging.
英文关键词	PV module degradation thin-film PV CdTe CIGS PV reliability
来源出版物	2020 47TH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC)
ISSN	0160-8371
出版年	2020
页码	1489-1493
ISBN	978-1-7281-6115-0
出版者	IEEE
类型	Proceedings Paper
语种	英语
收录类别	CPCI-S
WOS记录号	WOS:000653077100356
WOS关键词	DEGRADATION
WOS类目	Energy & Fuels ; Engineering, Electrical & Electronic
WOS研究方向	Energy & Fuels ; Engineering
资源类型	会议论文
条目标识符	http://119.78.100.177/qdio/handle/2XILL650/353052
作者单位	[Alheloo, Ahmad; John, Jim Joseph; Albadwawi, Omar; Almheiri, Ali; Alhamadani, Hebatalla; Hassan, Shaikha; Alnuaimi, Aaesha] Dubai Elect & Water Author DEWA, Res & Dev Ctr, Dubai, U Arab Emirates
推荐引用方式 GB/T 7714	Alheloo, Ahmad,John, Jim Joseph,Albadwawi, Omar,et al. Indoor characterisation of thin-film PV modules installed for 4.6 years in desert conditions[C]:IEEE,2020:1489-1493.