Arid
DOI10.12911/22998993/118274
Sweet Corn Yield Simulation Using Normalized Difference Vegetation Index and Leaf Area Index
Lykhovyd, Pavlo
通讯作者Lykhovyd, P
来源期刊JOURNAL OF ECOLOGICAL ENGINEERING
ISSN2299-8993
出版年2020
卷号21期号:3页码:228-236
英文摘要The authors determined the accuracy and reliability of yielding models by using the values of two differently obtained indices - the leaf area index (LAI) obtained through direct surface measurements, and the normalized difference vegetation index (NDVI) obtained through spatial remote sensing of crops. The study based on the drip-irrigated sweet corn yielded the data obtained in the field experiment held in the semi-arid climate on dark-chestnut soil in the South of Ukraine. The suitability of the LAI and NDVI for the simulation of sweet corn yields was estimated by the regression analysis of the yielding data by correlation (R) and determination (R-2) coefficients. Additionally, mathematical models for the crop yields estimation based on the regression analysis were developed. It was determined that LAI is a more suitable index for the crop yield prediction: the R-2 value was 0.92 and 0.94 against 0.85 for the NDVI-based models.I It was determined that it is better to use the LAI values obtained at the stage of flowering, when R-2 averaged to 0.94, and the NDVI-based models does not depend on the crop stage (the R-2 was 0.85 both for the flowering and ripening stages of the plant development). The combined NDVI-LAI model showed that there is no necessity in the complication of the LAI-based model through introduction of the remotely sensed index because of insignificant improvement in the performance (R-2 was 0.94 and 0.92).
英文关键词direct measurements mathematical model regression analysis remote sensing sweet corn yield prediction
类型Article
语种英语
开放获取类型Other Gold
收录类别ESCI
WOS记录号WOS:000526862500028
WOS关键词NDVI ; MODEL ; PHOTOSYNTHESIS ; REFLECTANCE ; INFORMATION ; PREDICTION ; EVI ; LAI
WOS类目Engineering, Environmental
WOS研究方向Engineering
资源类型期刊论文
条目标识符http://119.78.100.177/qdio/handle/2XILL650/334313
作者单位[Lykhovyd, Pavlo] Inst Irrigated Agr NAAS, Dept Sci & Innovat Act, Transfer Technol & Intellectual Property, UA-73483 Naddniprianske, Kherson, Ukraine
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GB/T 7714
Lykhovyd, Pavlo. Sweet Corn Yield Simulation Using Normalized Difference Vegetation Index and Leaf Area Index[J],2020,21(3):228-236.
APA Lykhovyd, Pavlo.(2020).Sweet Corn Yield Simulation Using Normalized Difference Vegetation Index and Leaf Area Index.JOURNAL OF ECOLOGICAL ENGINEERING,21(3),228-236.
MLA Lykhovyd, Pavlo."Sweet Corn Yield Simulation Using Normalized Difference Vegetation Index and Leaf Area Index".JOURNAL OF ECOLOGICAL ENGINEERING 21.3(2020):228-236.
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