Arid
DOI10.1117/12.2314830
Experimental research on infrared radiation measurement of typical natural background
Li Xia1,2,3; Liu Jianguo1,2; Dong Yanbing3; Liu Xingrun3; Lin Juan3
通讯作者Liu Jianguo
会议名称4th Seminar on Novel Optoelectronic Detection Technology and Application
会议日期OCT 24-26, 2017
会议地点Nanjing, PEOPLES R CHINA
英文摘要

Typical natural backgrounds include land, sea, desert, sky and so on, and experimental measurement is an effective means to obtain background radiation data. Because the background infrared radiation is affected by season, weather and the angle of solar radiation, it is necessary to collect environmental parameters at the same time during testing. The screening and collection of major environmental parameters is crucial for subsequent radiation data processing. In view of this problem, first of all, the influence of environmental reference on background infrared radiation was theoretically calculated by MODTRAN software, and the main parameters were screened out. A test program for radiation measurement of natural background is formed, which is used as a reference for the design of background infrared radiation measurement.


英文关键词background infrared radiation experiment scheme environment parameter
来源出版物FOURTH SEMINAR ON NOVEL OPTOELECTRONIC DETECTION TECHNOLOGY AND APPLICATION
ISSN0277-786X
EISSN1996-756X
出版年2018
卷号10697
EISBN978-1-5106-1948-7
出版者SPIE-INT SOC OPTICAL ENGINEERING
类型Proceedings Paper
语种英语
国家Peoples R China
收录类别CPCI-S
WOS记录号WOS:000435407700052
WOS类目Engineering, Electrical & Electronic ; Optics
WOS研究方向Engineering ; Optics
资源类型会议论文
条目标识符http://119.78.100.177/qdio/handle/2XILL650/307576
作者单位1.Chinese Acad Sci, Anhui Inst Opt & Fine Mech, Key Lab Environm Opt & Technol, Hefei 230031, Anhui, Peoples R China;
2.Univ Sci & Technol China, Hefei 230026, Anhui, Peoples R China;
3.Sci & Technol Opt Radiat Lab, Beijing 100854, Peoples R China
推荐引用方式
GB/T 7714
Li Xia,Liu Jianguo,Dong Yanbing,et al. Experimental research on infrared radiation measurement of typical natural background[C]:SPIE-INT SOC OPTICAL ENGINEERING,2018.
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