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DOI10.1117/12.2278691
Cycle time Reduction by Html Report in Mask Checking Flow
Chen, Jian-Cheng1; Lu, Min-Ying2; Fang, Xiang2; Shen, Ming-Feng2; Ma, Shou-Yuan2; Yang, Chuen-Huei1; Tsai, Joe1; Lee, Rachel1; Deng, Erwin1; Lin, Ling-Chieh2; Liao, Hung-Yueh2; Tsai, Jenny3; Bowhill, Amanda3; Vu, Hien3; Russell, Gordon3
通讯作者Chen, Jian-Cheng
会议名称Photomask Japan 24th Symposium on Photomask and Next-Generation Lithography Mask Technology
会议日期APR 05-07, 2017
会议地点Yokohama, JAPAN
英文摘要

The Mask Data Correctness Check (MDCC) is a reticle-level, multi-layer DRC-like check evolved from mask rule check (MRC). The MDCC uses extended job deck (EJB) to achieve mask composition and to perform a detailed check for positioning and integrity of each component of the reticle. Different design patterns on the mask will be mapped to different layers. Therefore, users may be able to review the whole reticle and check the interactions between different designs before the final mask pattern file is available. However, many types of MDCC check results, such as errors from overlapping patterns usually have very large and complex-shaped highlighted areas covering the boundary of the design. Users have to load the result OASIS file and overlap it to the original database that was assembled in MDCC process on a layout viewer, then search for the details of the check results. We introduce a quick result-reviewing method based on an html format report generated by Calibre (R) RVE. In the report generation process, we analyze and extract the essential part of result OASIS file to a result database (RDB) file by standard verification rule format (SVRF) commands. Calibre (R) RVE automatically loads the assembled reticle pattern and generates screen shots of these check results. All the processes are automatically triggered just after the MDCC process finishes. Users just have to open the html report to get the information they need: for example, check summary, captured images of results and their coordinates.


英文关键词Mask data preparation mask rule check mask data correctness check html report
来源出版物PHOTOMASK JAPAN 2017: XXIV SYMPOSIUM ON PHOTOMASK AND NEXT-GENERATION LITHOGRAPHY MASK TECHNOLOGY
ISSN0277-786X
EISSN1996-756X
出版年2017
卷号10454
ISBN978-1-5106-1389-8
EISBN978-1-5106-1390-4
出版者SPIE-INT SOC OPTICAL ENGINEERING
类型Proceedings Paper
语种英语
国家Taiwan;USA
收录类别CPCI-S
WOS记录号WOS:000422620600014
WOS类目Optics ; Physics, Applied
WOS研究方向Optics ; Physics
资源类型会议论文
条目标识符http://119.78.100.177/qdio/handle/2XILL650/307001
作者单位1.United Microelect Corp, 3,Li Hsin Rd 2,Hsinchu Sci Pk, Hsinchu 30078, Taiwan;
2.Mentor Graph Corp, 120,Sec 2,Gongdao 5th Rd, Hsinchu 300, Taiwan;
3.Mentor Graph Corp, 46885 Bayside Pkwy, Fremont, CA 94538 USA
推荐引用方式
GB/T 7714
Chen, Jian-Cheng,Lu, Min-Ying,Fang, Xiang,et al. Cycle time Reduction by Html Report in Mask Checking Flow[C]:SPIE-INT SOC OPTICAL ENGINEERING,2017.
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