Knowledge Resource Center for Ecological Environment in Arid Area
DOI | 10.1117/12.2278691 |
Cycle time Reduction by Html Report in Mask Checking Flow | |
Chen, Jian-Cheng1; Lu, Min-Ying2; Fang, Xiang2; Shen, Ming-Feng2; Ma, Shou-Yuan2; Yang, Chuen-Huei1; Tsai, Joe1; Lee, Rachel1; Deng, Erwin1; Lin, Ling-Chieh2; Liao, Hung-Yueh2; Tsai, Jenny3; Bowhill, Amanda3; Vu, Hien3; Russell, Gordon3 | |
通讯作者 | Chen, Jian-Cheng |
会议名称 | Photomask Japan 24th Symposium on Photomask and Next-Generation Lithography Mask Technology |
会议日期 | APR 05-07, 2017 |
会议地点 | Yokohama, JAPAN |
英文摘要 | The Mask Data Correctness Check (MDCC) is a reticle-level, multi-layer DRC-like check evolved from mask rule check (MRC). The MDCC uses extended job deck (EJB) to achieve mask composition and to perform a detailed check for positioning and integrity of each component of the reticle. Different design patterns on the mask will be mapped to different layers. Therefore, users may be able to review the whole reticle and check the interactions between different designs before the final mask pattern file is available. However, many types of MDCC check results, such as errors from overlapping patterns usually have very large and complex-shaped highlighted areas covering the boundary of the design. Users have to load the result OASIS file and overlap it to the original database that was assembled in MDCC process on a layout viewer, then search for the details of the check results. We introduce a quick result-reviewing method based on an html format report generated by Calibre (R) RVE. In the report generation process, we analyze and extract the essential part of result OASIS file to a result database (RDB) file by standard verification rule format (SVRF) commands. Calibre (R) RVE automatically loads the assembled reticle pattern and generates screen shots of these check results. All the processes are automatically triggered just after the MDCC process finishes. Users just have to open the html report to get the information they need: for example, check summary, captured images of results and their coordinates. |
英文关键词 | Mask data preparation mask rule check mask data correctness check html report |
来源出版物 | PHOTOMASK JAPAN 2017: XXIV SYMPOSIUM ON PHOTOMASK AND NEXT-GENERATION LITHOGRAPHY MASK TECHNOLOGY |
ISSN | 0277-786X |
EISSN | 1996-756X |
出版年 | 2017 |
卷号 | 10454 |
ISBN | 978-1-5106-1389-8 |
EISBN | 978-1-5106-1390-4 |
出版者 | SPIE-INT SOC OPTICAL ENGINEERING |
类型 | Proceedings Paper |
语种 | 英语 |
国家 | Taiwan;USA |
收录类别 | CPCI-S |
WOS记录号 | WOS:000422620600014 |
WOS类目 | Optics ; Physics, Applied |
WOS研究方向 | Optics ; Physics |
资源类型 | 会议论文 |
条目标识符 | http://119.78.100.177/qdio/handle/2XILL650/306841 |
作者单位 | 1.United Microelect Corp, 3,Li Hsin Rd 2,Hsinchu Sci Pk, Hsinchu 30078, Taiwan; 2.Mentor Graph Corp, 120,Sec 2,Gongdao 5th Rd, Hsinchu 300, Taiwan; 3.Mentor Graph Corp, 46885 Bayside Pkwy, Fremont, CA 94538 USA |
推荐引用方式 GB/T 7714 | Chen, Jian-Cheng,Lu, Min-Ying,Fang, Xiang,et al. Cycle time Reduction by Html Report in Mask Checking Flow[C]:SPIE-INT SOC OPTICAL ENGINEERING,2017. |
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