Knowledge Resource Center for Ecological Environment in Arid Area
PROGNOSTICS OF DAMAGE ACCRUAL IN SSL LUMINAIRES AND DRIVERS SUBJECTED TO HTSL ACCELERATED AGING | |
Lall, Pradeep1,2; Sakalaukus, Peter1,2; Davis, Lynn3 | |
通讯作者 | Lall, Pradeep |
会议名称 | ASME International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems |
会议日期 | JUL 16-18, 2013 |
会议地点 | Burlingame, CA |
英文摘要 | This paper will show an investigation of off-the-shelf luminaires with the focus on the LED electronic drivers, specifically the aluminum electrolytic capacitors (AECs), that have been aged using high temperature shelf life (HTSL) testing of 135 degrees C in order to prognosticate the remaining useful life of the luminaires. Luminaires have the potential of seeing excessive temperatures when being transported across the country or being stored in non-climate controlled warehouses. They are also being used in outdoor applications in desert environments that see little or no humidity but will experience extremely high temperatures during the day. This makes it important to increase our understanding of what effects being stored at high temperatures for a prolonged period of time will have on the usability and survivability of these devices. The U.S. Department of Energy has made a long term commitment to advance the efficiency, understanding and development of solid-state lighting (SSL) and is making a strong push for the acceptance and use of SSL products. In this work, the four AECs of three different types inside each LED electronic driver were studied. The change in capacitance and the change in equivalent series resistance (ESR) of the AECs were measured and considered to be a leading indication of failure of the LED system. These indicators were used to make remaining useful life predictions to develop an algorithm to predict the end of life of the AECs. The luminous flux of a pristine downlight module was also monitored using each LED electronic driver that was subjected to HTSL through the progression of the testing to determine a correlation between the light output of the lamp and the failing components of the LED electronic driver. Prognostic and Health Management (PIM) is a useful tool for assessment of the remaining life of electrical components and is demonstrated for AECs in this work. |
英文关键词 | Prognostics Solid-State Lighting Electrolytic Capacitors |
来源出版物 | PROCEEDINGS OF THE ASME INTERNATIONAL TECHNICAL CONFERENCE AND EXHIBITION ON PACKAGING AND INTEGRATION OF ELECTRONIC AND PHOTONIC MICROSYSTEMS, 2013, VOL 1 |
出版年 | 2014 |
ISBN | 978-0-7918-5575-1 |
出版者 | AMER SOC MECHANICAL ENGINEERS |
类型 | Proceedings Paper |
语种 | 英语 |
国家 | USA |
收录类别 | CPCI-S |
WOS记录号 | WOS:000361499600034 |
WOS类目 | Engineering, Electrical & Electronic ; Engineering, Mechanical ; Operations Research & Management Science ; Materials Science, Multidisciplinary |
WOS研究方向 | Engineering ; Operations Research & Management Science ; Materials Science |
资源类型 | 会议论文 |
条目标识符 | http://119.78.100.177/qdio/handle/2XILL650/302976 |
作者单位 | 1.Auburn Univ, Dept Mech Engn, Auburn, AL 36849 USA; 2.Auburn Univ, NSF CAVE Elect Res Ctr 3, Auburn, AL 36849 USA; 3.RTI Int, Res Triangle Pk, NC 27709 USA |
推荐引用方式 GB/T 7714 | Lall, Pradeep,Sakalaukus, Peter,Davis, Lynn. PROGNOSTICS OF DAMAGE ACCRUAL IN SSL LUMINAIRES AND DRIVERS SUBJECTED TO HTSL ACCELERATED AGING[C]:AMER SOC MECHANICAL ENGINEERS,2014. |
条目包含的文件 | 条目无相关文件。 |
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。