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PROGNOSTICS OF DAMAGE ACCRUAL IN SSL LUMINAIRES AND DRIVERS SUBJECTED TO HTSL ACCELERATED AGING
Lall, Pradeep1,2; Sakalaukus, Peter1,2; Davis, Lynn3
通讯作者Lall, Pradeep
会议名称ASME International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems
会议日期JUL 16-18, 2013
会议地点Burlingame, CA
英文摘要

This paper will show an investigation of off-the-shelf luminaires with the focus on the LED electronic drivers, specifically the aluminum electrolytic capacitors (AECs), that have been aged using high temperature shelf life (HTSL) testing of 135 degrees C in order to prognosticate the remaining useful life of the luminaires. Luminaires have the potential of seeing excessive temperatures when being transported across the country or being stored in non-climate controlled warehouses. They are also being used in outdoor applications in desert environments that see little or no humidity but will experience extremely high temperatures during the day. This makes it important to increase our understanding of what effects being stored at high temperatures for a prolonged period of time will have on the usability and survivability of these devices. The U.S. Department of Energy has made a long term commitment to advance the efficiency, understanding and development of solid-state lighting (SSL) and is making a strong push for the acceptance and use of SSL products. In this work, the four AECs of three different types inside each LED electronic driver were studied. The change in capacitance and the change in equivalent series resistance (ESR) of the AECs were measured and considered to be a leading indication of failure of the LED system. These indicators were used to make remaining useful life predictions to develop an algorithm to predict the end of life of the AECs. The luminous flux of a pristine downlight module was also monitored using each LED electronic driver that was subjected to HTSL through the progression of the testing to determine a correlation between the light output of the lamp and the failing components of the LED electronic driver. Prognostic and Health Management (PIM) is a useful tool for assessment of the remaining life of electrical components and is demonstrated for AECs in this work.


英文关键词Prognostics Solid-State Lighting Electrolytic Capacitors
来源出版物PROCEEDINGS OF THE ASME INTERNATIONAL TECHNICAL CONFERENCE AND EXHIBITION ON PACKAGING AND INTEGRATION OF ELECTRONIC AND PHOTONIC MICROSYSTEMS, 2013, VOL 1
出版年2014
ISBN978-0-7918-5575-1
出版者AMER SOC MECHANICAL ENGINEERS
类型Proceedings Paper
语种英语
国家USA
收录类别CPCI-S
WOS记录号WOS:000361499600034
WOS类目Engineering, Electrical & Electronic ; Engineering, Mechanical ; Operations Research & Management Science ; Materials Science, Multidisciplinary
WOS研究方向Engineering ; Operations Research & Management Science ; Materials Science
资源类型会议论文
条目标识符http://119.78.100.177/qdio/handle/2XILL650/302976
作者单位1.Auburn Univ, Dept Mech Engn, Auburn, AL 36849 USA;
2.Auburn Univ, NSF CAVE Elect Res Ctr 3, Auburn, AL 36849 USA;
3.RTI Int, Res Triangle Pk, NC 27709 USA
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Lall, Pradeep,Sakalaukus, Peter,Davis, Lynn. PROGNOSTICS OF DAMAGE ACCRUAL IN SSL LUMINAIRES AND DRIVERS SUBJECTED TO HTSL ACCELERATED AGING[C]:AMER SOC MECHANICAL ENGINEERS,2014.
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