Arid
DOI10.1117/12.894928
PERFORMANCE DEGRADATION OF GRID-TIED PHOTOVOLTAIC MODULES IN A HOT-DRY CLIMATIC CONDITION
Suleske, Adam; Singh, Jaspreet; Kuitche, Joseph; TamizhMani, GovindaSamy
通讯作者Suleske, Adam
会议名称Conference on Reliability of Photovoltaic Cells, Modules, Components and Systems IV
会议日期AUG 22-25, 2011
会议地点San Diego, CA
英文摘要

The crystalline silicon photovoltaic (PV) modules under open circuit conditions typically degrade at a rate of about 0.5% per year. However, it is suspected that the modules in an array level may degrade, depending on equipment/frame grounding and array grounding, at higher rates because of higher string voltage and increased module mismatch over the years of operation in the field. This paper compares and analyzes the degradation rates of grid-tied photovoltaic modules operating over 10-17 years in a desert climatic condition of Arizona. The nameplate open-circuit voltages of the arrays ranged between 400 and 450 V. Six different types/models of crystalline silicon modules with glass/glass and glass/polymer constructions were evaluated. About 1865 modules were inspected using an extended visual inspection checklist and infrared (IR) scanning. The visual inspection checklist included encapsulant discoloration, cell/interconnect cracks, delamination and corrosion. Based on the visual inspection and IR studies, a large fraction of these modules were identified as allegedly healthy and unhealthy modules and they were electrically isolated from the system for currentvoltage (I-V) measurements of individual modules. The annual degradation rate for each module type is determined based on the I-V measurements.


英文关键词degradation failure modes reliability
来源出版物RELIABILITY OF PHOTOVOLTAIC CELLS, MODULES, COMPONENTS, AND SYSTEMS IV
ISSN0277-786X
EISSN1996-756X
出版年2011
卷号8112
EISBN978-0-8194-8722-3
出版者SPIE-INT SOC OPTICAL ENGINEERING
类型Proceedings Paper
语种英语
国家USA
收录类别CPCI-S
WOS记录号WOS:000306290300023
WOS类目Energy & Fuels ; Engineering, Electrical & Electronic ; Optics
WOS研究方向Energy & Fuels ; Engineering ; Optics
资源类型会议论文
条目标识符http://119.78.100.177/qdio/handle/2XILL650/300038
作者单位Arizona State Univ, Photovolta Reliabil Lab, Tempe, AZ 85287 USA
推荐引用方式
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Suleske, Adam,Singh, Jaspreet,Kuitche, Joseph,et al. PERFORMANCE DEGRADATION OF GRID-TIED PHOTOVOLTAIC MODULES IN A HOT-DRY CLIMATIC CONDITION[C]:SPIE-INT SOC OPTICAL ENGINEERING,2011.
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