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DOI	10.1117/12.796421
	Polarization measurements made on LFRA and OASIS emitter arrays
	Geske, Jon 1; Sparkman, Kevin 2; Oleson, Jim 2; Laveigne, Joe 2; Sieglinger, Breck 3; Marlow, Steve 3; Lowry, Heard 4; Burns, James 4
通讯作者	Geske, Jon
会议名称	Conference on Technologies for Synthetic Environments - Hardware-in-the-Loop Testing XIII
会议日期	MAR 17-18, 2008
会议地点	Orlando, FL
英文摘要	Polarization is increasingly being considered as a method of discrimination in passive sensing applications. In this paper the degree of polarization of the thermal emission from the emitter arrays of two new Santa Barbara Infrared (SBIR) micro-bolometer resistor array scene projectors was characterized at ambient temperature and at 77 K. The emitter arrays characterized were from the Large Format Resistive Array (LFRA) and the Optimized Arrays for Space-Background Infrared Simulation (OASIS) scene projectors. This paper reports the results of this testing.
英文关键词	OASIS LFRA scene projector resistor array micro-bolometer thermal emitter polarization imaging
来源出版物	TECHNOLOGIES FOR SYNTHETIC ENVIRONMENTS: HARDWARE-IN-THE-LOOP TESTING XIII
ISSN	0277-786X
出版年	2008
卷号	6942
ISBN	978-0-8194-7133-8
出版者	SPIE-INT SOC OPTICAL ENGINEERING
类型	Proceedings Paper
语种	英语
国家	USA
收录类别	CPCI-S
WOS记录号	WOS:000257113800016
WOS类目	Computer Science, Hardware & Architecture ; Optics
WOS研究方向	Computer Science ; Optics
资源类型	会议论文
条目标识符	http://119.78.100.177/qdio/handle/2XILL650/297442
作者单位	1.Aerius Photon LLC, Ventura, CA USA; 2.Santa Barbara Infrared Inc, Santa Barbara, CA USA; 3.MacAulay Brown Inc, KHILS, Eglin AFB, FL USA; 4.Arnold Engn Dev Ctr AEDC, Arnold AFB, TN USA
推荐引用方式 GB/T 7714	Geske, Jon,Sparkman, Kevin,Oleson, Jim,et al. Polarization measurements made on LFRA and OASIS emitter arrays[C]:SPIE-INT SOC OPTICAL ENGINEERING,2008.