Knowledge Resource Center for Ecological Environment in Arid Area
DOI | 10.1109/DRPT.2008.4523845 |
Study on impacts of large-scale photovoltaic power station on power grid voltage profile | |
Wang Yi-bo; Wu Chun-sheng; Liao Hua; Xu Hong-hua | |
通讯作者 | Wang Yi-bo |
会议名称 | 3rd International Conference on Electric Utility Deregulation, Restructuring and Power Technologies |
会议日期 | APR 06-09, 2008 |
会议地点 | Nanjing, PEOPLES R CHINA |
英文摘要 | The large-scale photovoltaic (LSPV) power station in desert usually connects to local electric grid through long high-voltage transmission lines. However, it will impact the voltage profile along the transmission line due to the solar irradiance nature. In this paper, a simple and accurate method based on power system analysis principle is developed to analyze impacts of the grid-connected LSPV power station on voltage profile. Then, the method is verified through comparing to power flow analysis. From the results, the bus voltage presents a parabolic trend with the PV power output increasing; there is a maximum voltage point on each V-P curve, and the corresponding PV power output is determined by the impedances; the bus voltage sensitivity is also a nonlinear function of PV power output. |
英文关键词 | grid-connected PV generation large-scale photovoltaic power station power system analysis voltage profile |
来源出版物 | 2008 THIRD INTERNATIONAL CONFERENCE ON ELECTRIC UTILITY DEREGULATION AND RESTRUCTURING AND POWER TECHNOLOGIES, VOLS 1-6 |
出版年 | 2008 |
页码 | 2575-2579 |
ISBN | 978-7-5641-1249-3 |
出版者 | IEEE |
类型 | Proceedings Paper |
语种 | 英语 |
国家 | Peoples R China |
收录类别 | CPCI-S |
WOS记录号 | WOS:000259032601214 |
WOS类目 | Energy & Fuels ; Engineering, Electrical & Electronic |
WOS研究方向 | Energy & Fuels ; Engineering |
资源类型 | 会议论文 |
条目标识符 | http://119.78.100.177/qdio/handle/2XILL650/296946 |
作者单位 | Chinese Acad Sci, Inst Elect Engn, Beijing, Peoples R China |
推荐引用方式 GB/T 7714 | Wang Yi-bo,Wu Chun-sheng,Liao Hua,et al. Study on impacts of large-scale photovoltaic power station on power grid voltage profile[C]:IEEE,2008:2575-2579. |
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