Arid
DOI10.1117/12.686491
A memory efficient large mask data handling method using repetition
Choi, Jin-Sook; Shin, Jae-Pil; Lee, Jong-Bae; Yoo, Moon-Hyun; Kong, Jeong-Taek
通讯作者Choi, Jin-Sook
会议名称26th Annual BACUS Symposium on Photomask Technology
会议日期SEP 19-22, 2006
会议地点Monterey, CA
英文摘要

After model-based OPC and layer generation, the size of mask data is increasing beyond the limit that current software and hardware can handle. The file size of one of 512M DRAM mask data was 29 GB in GDSII and it could be reduced to 1.7 GB by transforming into OASIS. Compared to GDSII, OASIS included many effective features that could reduce the file size incredibly. In this paper, we adopted the repetitions in OASIS and used the concept to reduce the memory usage of mask data preparation software. We built a new data structure, called shape array that utilizes the repetition of mask data. Mask data is saved in OASIS and its repetition information is loaded onto memory. The data structure can be the basis for the mask data preparation operations such as region query, AND, XOR and so on. We implemented the region query in this paper. The region query is a major operation that a layout viewer uses. The mask data comparison operation, which is used to check the integrity of the mask data, is implemented with the shape array as well. The shape array method has used the memory of between 2 and 22 times less than the method that keeps the coordinate and attributes of each shape individually. The file loading time and the file writing time have improved 4 similar to 73 times and 1.5 similar to 14 times, respectively.


英文关键词repetition OASIS mask data preparation
来源出版物PHOTOMASK TECHNOLOGY 2006, PTS 1 AND 2
ISSN0277-786X
出版年2006
卷号6349
ISBN978-0-8194-6444-6
出版者SPIE-INT SOC OPTICAL ENGINEERING
类型Proceedings Paper
语种英语
国家South Korea
收录类别CPCI-S
WOS记录号WOS:000243620500038
WOS关键词FORMAT
WOS类目Optics ; Imaging Science & Photographic Technology
WOS研究方向Optics ; Imaging Science & Photographic Technology
资源类型会议论文
条目标识符http://119.78.100.177/qdio/handle/2XILL650/296127
作者单位(1)CAE, Samsung Elect Co Ltd, Semicond R&D Ctr, Hwasung 445701, Gyeonggi Do, South Korea
推荐引用方式
GB/T 7714
Choi, Jin-Sook,Shin, Jae-Pil,Lee, Jong-Bae,et al. A memory efficient large mask data handling method using repetition[C]:SPIE-INT SOC OPTICAL ENGINEERING,2006.
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