Arid
DOI10.1117/12.681801
Evaluation of OASIS.VSB (SEMI P44) for practical use
Kuriyama, Koki; Suzuki, Toshio; Narukawa, Shogo; Mohri, Hiroshi; Hoga, Morihisa; Hayashi, Naoya
通讯作者Kuriyama, Koki
会议名称Conference on Photomask and Next-Generation Lithography Mask Technology XIII
会议日期APR 18-20, 2006
会议地点Yokohama, JAPAN
英文摘要

Over the last 5 years, Japanese consortium, Semiconductor Leading Edge Technologies Inc. (Selete), lead the way in developing unified mask data format. Specification of the format was released as OASIS.VSB and registered to SEMI standard, P44. It is expected that using OASIS.VSB would reduce TAT and improve efficient usage of data infrastructure. OASIS.VSB has advantages for mask data preparation since OASIS.VSB is based on OASIS (TM) (SEMI P39) and OASIS compliant software is already commercially available.


Although fundamental evaluation of OASIS.VSB have been made by Selete on technical feasibility with VSB mask writers, its performance and advantage of data handling improvement is still controversial. We have been evaluating OASIS.VSB in order to estimate the impact of data handling improvement at mask manufacturer. Figure 1 shows that OASIS.VSB has good compression ratio compared to certain VSB mask data format. Although compression ratio partly depends on data and conversion software, OASIS.VSB is about 0.7 times as small as VSB data format on weighted basis average. Furthermore, we have confirmed by simulation that OASIS.VSB can hardly affect shot count and writing time.


Unification of mask data format by OASIS.VSB can realize flexible mask data preparation (MDP) and reduce a cost of data storage. To achieve further TAT reduction, it is necessary to apply OASIS.VSB to not only mask writing data but other mask making processes such as die to database inspection and mask rule check (MRC).


来源出版物PHOTOMASK AND NEXT GENERATION LITHOGRAPHY MASK TECHNOLOGY XIII, PTS 1 AND 2
ISSN0277-786X
出版年2006
卷号6283
ISBN0-8194-6358-2
出版者SPIE-INT SOC OPTICAL ENGINEERING
类型Proceedings Paper
语种英语
国家Japan
收录类别CPCI-S
WOS记录号WOS:000239451500083
WOS类目Optics ; Imaging Science & Photographic Technology
WOS研究方向Optics ; Imaging Science & Photographic Technology
资源类型会议论文
条目标识符http://119.78.100.177/qdio/handle/2XILL650/296124
作者单位Dai Nippon Printing Co Ltd, Elect Device Lab, 2-2-1,Fukuoka, Fujimino, Saitama 3568507, Japan
推荐引用方式
GB/T 7714
Kuriyama, Koki,Suzuki, Toshio,Narukawa, Shogo,et al. Evaluation of OASIS.VSB (SEMI P44) for practical use[C]:SPIE-INT SOC OPTICAL ENGINEERING,2006.
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