Arid
DOI10.1117/12.535683
OASIS - based data preparation flows: Progress report on containing data size explosion
Schulze, S; LaCour, P; Grodd, L
通讯作者Schulze, S
会议名称Conference on Design and Process Integration for Microelectronic Manufacturing II
会议日期FEB 26-27, 2004
会议地点Santa Clara, CA
英文摘要

The ever-increasing complexity of integrated circuits and their enabling process technology has accelerated the increase in data volume of post-RET data which is input to the photomask manufacturing industry. OASIS - the new stream format that has been developed by a working group under the sponsorship of the SEMI Data Path Task Force enables the representation of IC layout data in a much more compact form than GDSII and facilitates the incorporation of hierarchical data into the mask-making infrastructure. OASIS achieves on average a >10x reduction in file size compared to GDSII files and structures the data in a way, which allows a straightforward translation from a hierarchical format to the required flat mask perspective. Owing to the efficiency in representing the data, OASIS files are smaller than commonly used flat exchange formats - like MEBES, thus enabling an efficient hierarchical data flow both from the processing as well as the file handling prospective.


The implementation of OASIS into post-tapeout data flows will be discussed and experimental results on OASIS-based data preparation flows will be shown.


英文关键词GDSH stream OASIS integrated circuit layout mask making photomask hierarchical processing
来源出版物DESIGN AND PROCESS INTEGRATION FOR MICROELECTRONIC MANUFACTURING II
ISSN0277-786X
出版年2004
卷号5379
页码149-157
ISBN0-8194-5292-0
出版者SPIE-INT SOC OPTICAL ENGINEERING
类型Proceedings Paper
语种英语
国家USA
收录类别CPCI-S
WOS记录号WOS:000222008400018
WOS类目Engineering, Manufacturing ; Engineering, Electrical & Electronic
WOS研究方向Engineering
资源类型会议论文
条目标识符http://119.78.100.177/qdio/handle/2XILL650/294815
作者单位(1)Mentor Graph Corp, Wilsonville, OR 97070 USA
推荐引用方式
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Schulze, S,LaCour, P,Grodd, L. OASIS - based data preparation flows: Progress report on containing data size explosion[C]:SPIE-INT SOC OPTICAL ENGINEERING,2004:149-157.
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