Arid
DOI10.1109/36.842006
Arid land surface characterization with repeat-pass SAR interferometry
Wegmuller, U; Strozzi, T; Farr, T; Werner, CL
通讯作者Wegmuller, U
会议名称2nd International Workshop on Retrieval of Bio and Geo Physical Parameters from SAR Data for Land Applications
会议日期OCT 21-23, 1998
会议地点NOORDWIJK, NETHERLANDS
英文摘要

Repeat pass ERS SAR interferometry was used to map different surface types of the Death Valley Salt Pan. At this arid site, the surface roughness varies between extremely smooth (salt lakes, clay pan) and very rough (alluvial fans, eroded salt formations). The moisture varies from very dry (alluvial fans) to wet (wet clay, salt crust with water ponds) with seasonal changes in certain areas. While the surface geometry is stable for certain surface types (alluvial fans, thick salt crusts), it changes for others as a result of the changing water level and erosion by wind and rain. The changing surface roughness, moisture, and vegetation conditions cause large variations of the backscattering and coherence. This information is used to distinguish different surface types, Furthermore, interferometry was used to map the topographic height. In a second part of the study, the potential of the degree of coherence to retrieve information on the vegetation density and the surface erasion was evaluated.


英文关键词classification coherence interferometry vegetation density
来源出版物IEEE TRANSACTIONS ON GEOSCIENCE AND REMOTE SENSING
ISSN0196-2892
出版年2000
卷号38
期号2
页码776-781
出版者IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
类型Article;Proceedings Paper
语种英语
国家Switzerland;USA
收录类别CPCI-S ; SCI-E
WOS记录号WOS:000086499700015
WOS关键词FOREST
WOS类目Geochemistry & Geophysics ; Engineering, Electrical & Electronic ; Remote Sensing ; Imaging Science & Photographic Technology
WOS研究方向Geochemistry & Geophysics ; Engineering ; Remote Sensing ; Imaging Science & Photographic Technology
资源类型会议论文
条目标识符http://119.78.100.177/qdio/handle/2XILL650/293029
作者单位(1)GAMMA Remote Sensing, Bern, Switzerland;(2)CALTECH, Jet Prop Lab, Pasadena, CA 91109 USA
推荐引用方式
GB/T 7714
Wegmuller, U,Strozzi, T,Farr, T,et al. Arid land surface characterization with repeat-pass SAR interferometry[C]:IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC,2000:776-781.
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