Knowledge Resource Center for Ecological Environment in Arid Area
DOI | 10.1109/36.842006 |
Arid land surface characterization with repeat-pass SAR interferometry | |
Wegmuller, U; Strozzi, T; Farr, T; Werner, CL | |
通讯作者 | Wegmuller, U |
会议名称 | 2nd International Workshop on Retrieval of Bio and Geo Physical Parameters from SAR Data for Land Applications |
会议日期 | OCT 21-23, 1998 |
会议地点 | NOORDWIJK, NETHERLANDS |
英文摘要 | Repeat pass ERS SAR interferometry was used to map different surface types of the Death Valley Salt Pan. At this arid site, the surface roughness varies between extremely smooth (salt lakes, clay pan) and very rough (alluvial fans, eroded salt formations). The moisture varies from very dry (alluvial fans) to wet (wet clay, salt crust with water ponds) with seasonal changes in certain areas. While the surface geometry is stable for certain surface types (alluvial fans, thick salt crusts), it changes for others as a result of the changing water level and erosion by wind and rain. The changing surface roughness, moisture, and vegetation conditions cause large variations of the backscattering and coherence. This information is used to distinguish different surface types, Furthermore, interferometry was used to map the topographic height. In a second part of the study, the potential of the degree of coherence to retrieve information on the vegetation density and the surface erasion was evaluated. |
英文关键词 | classification coherence interferometry vegetation density |
来源出版物 | IEEE TRANSACTIONS ON GEOSCIENCE AND REMOTE SENSING |
ISSN | 0196-2892 |
出版年 | 2000 |
卷号 | 38 |
期号 | 2 |
页码 | 776-781 |
出版者 | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |
类型 | Article;Proceedings Paper |
语种 | 英语 |
国家 | Switzerland;USA |
收录类别 | CPCI-S ; SCI-E |
WOS记录号 | WOS:000086499700015 |
WOS关键词 | FOREST |
WOS类目 | Geochemistry & Geophysics ; Engineering, Electrical & Electronic ; Remote Sensing ; Imaging Science & Photographic Technology |
WOS研究方向 | Geochemistry & Geophysics ; Engineering ; Remote Sensing ; Imaging Science & Photographic Technology |
资源类型 | 会议论文 |
条目标识符 | http://119.78.100.177/qdio/handle/2XILL650/293029 |
作者单位 | (1)GAMMA Remote Sensing, Bern, Switzerland;(2)CALTECH, Jet Prop Lab, Pasadena, CA 91109 USA |
推荐引用方式 GB/T 7714 | Wegmuller, U,Strozzi, T,Farr, T,et al. Arid land surface characterization with repeat-pass SAR interferometry[C]:IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC,2000:776-781. |
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