Arid
DOI10.1109/TGRS.2019.2908170
Observed Relationship Between BRF Spectral-Continuum Variance and Macroscopic Roughness of Clay Sediments
Badura, Gregory1,2; Bachmann, Charles M.1; Harms, Justin1,3; Abelev, Andrei4
通讯作者Badura, Gregory
来源期刊IEEE TRANSACTIONS ON GEOSCIENCE AND REMOTE SENSING
ISSN0196-2892
EISSN1558-0644
出版年2019
卷号57期号:9页码:6726-6740
英文摘要Spectral data offer a means of estimating the critical parameters of sediments, including sediment composition, moisture content, surface roughness, density, and grain-size distribution. Macroscopic surface roughness in particular has a substantial impact on the structure of the bidirectional reflectance factor (BRF) and the angular distribution of scattered light. In developing the models to invert the properties of the surface beyond just surface composition, roughness must also be accounted for in order to achieve reliable and repeatable results. This paper outlines laboratory studies in which the BRF and surface digital elevation measurements were performed on dry clay sediments. The results were used to explore the suitability of various roughness metrics to account for the radiometric effect of surface roughness. The metrics that are specifically addressed in this paper include random roughness and sill variance. Relative accuracy and tradeoffs between these metrics are described. We find that spectral variability, especially near spectral absorption features, correlates strongly with the quantified measures of surface roughness. We also find that spectral variability is sensitive to the sensor fore-optic size. The results suggest that roughness parameters might be directly determined from the spectrum itself. The relationship between spectral variability and macroscopic surface roughness was particularly strong in some broad spectral ranges of the visible, near infrared, and shortwave infrared, including the near-infrared region between 600 and 850 nm.
英文关键词Bidirectional reflectance factor (BRF) digital elevation model (DEM) goniometer of the Rochester Institute of Technology-two (GRIT-T) roughness sediment
类型Article
语种英语
国家USA
开放获取类型Bronze
收录类别SCI-E
WOS记录号WOS:000484209000034
WOS关键词BIDIRECTIONAL REFLECTANCE ; SURFACE-ROUGHNESS ; PARTICLE-SIZE ; SOIL ; SPECTROSCOPY ; ILLUMINATION ; DESERT ; DEPTH ; SCALE
WOS类目Geochemistry & Geophysics ; Engineering, Electrical & Electronic ; Remote Sensing ; Imaging Science & Photographic Technology
WOS研究方向Geochemistry & Geophysics ; Engineering ; Remote Sensing ; Imaging Science & Photographic Technology
资源类型期刊论文
条目标识符http://119.78.100.177/qdio/handle/2XILL650/216255
作者单位1.Rochester Inst Technol, Chester F Carlson Ctr Imaging Sci, Rochester, NY 14623 USA;
2.GTRI, Atlanta, GA 30318 USA;
3.US Air Force, Washington, DC USA;
4.US Naval Res Lab, Marine Geosci Div, Washington, DC 20375 USA
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Badura, Gregory,Bachmann, Charles M.,Harms, Justin,et al. Observed Relationship Between BRF Spectral-Continuum Variance and Macroscopic Roughness of Clay Sediments[J],2019,57(9):6726-6740.
APA Badura, Gregory,Bachmann, Charles M.,Harms, Justin,&Abelev, Andrei.(2019).Observed Relationship Between BRF Spectral-Continuum Variance and Macroscopic Roughness of Clay Sediments.IEEE TRANSACTIONS ON GEOSCIENCE AND REMOTE SENSING,57(9),6726-6740.
MLA Badura, Gregory,et al."Observed Relationship Between BRF Spectral-Continuum Variance and Macroscopic Roughness of Clay Sediments".IEEE TRANSACTIONS ON GEOSCIENCE AND REMOTE SENSING 57.9(2019):6726-6740.
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