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Long-term experiment on p-type crystalline PV module with potential induced degradation: Impact on power performance and evaluation of recovery mode 期刊论文
发表期刊: RENEWABLE ENERGY. 出版年: 2022, 卷号: 183, 页码: 472-479
作者:  Bouaichi, Abdellatif;  Merrouni, Ahmed Alami;  El Amrani, Aumeur;  Jaeckel, Bengt;  Hajjaj, Charaf;  Naimi, Zakaria;  Messaoudi, Choukri
收藏  |  浏览/下载：45/0  |  提交时间：2022/02/12
PID  Outdoor inspection  Power drop  Recovery period  Electroluminescence  Bias polarity  
Main degradation mechanisms of silicon solar cells in Algerian desert climates 期刊论文
发表期刊: SOLAR ENERGY. 出版年: 2021, 卷号: 224, 页码: 279-284
作者:  Kherici, Zoubida;  Kahoul, Nabil;  Cheghib, Hocine;  Younes, Mohammed;  Affari, Belhadj Chekal
收藏  |  浏览/下载：18/0  |  提交时间：2021/11/19
Silicon solar cells  Encapsulant discoloration  Visual inspection  Hot desert  Degradation mechanisms  
SUSTAINABLE DEVELOPMENT OF CROP PRODUCTION WITH ELEMENTS OF PRECISION AGRICULTURE IN NORTHERN KAZAKHSTAN 期刊论文
发表期刊: ENTREPRENEURSHIP AND SUSTAINABILITY ISSUES. 出版年: 2020, 卷号: 7, 期号: 4, 页码: 3200-3214
作者:  Abuova, Altynay B.;  Tulkubayeva, Saniya A.;  Tulayev, Yuriy V.;  Somova, Svetlana V.;  Kizatova, Maigul Zh.
收藏  |  浏览/下载：53/0  |  提交时间：2021/01/08
precision agriculture  crop management  IT-technologies  information systems  electronic field map  agrochemical field inspection  efficiency  comparative analysis  economic implementation mode  
Bearding the scorpion in his den: desert isopods take risks to validate their 'landscape of fear' assessment 期刊论文
发表期刊: OIKOS. 出版年: 2019, 卷号: 128, 期号: 10, 页码: 1458-1466
作者:  Zaguri, Moshe;  Hawlena, Dror
收藏  |  浏览/下载：32/0  |  提交时间：2020/03/23
desert isopods  information decay costs  landscape of fear  predation risk  predator inspection  risk assessment  
Degradation analysis of m-c-Si PV modules after long term exposure under desert climate 会议论文
会议名称: 20th International Middle East Power Systems Conference (MEPCON). 会议地点: Cairo, EGYPT. 会议日期: DEC 18-20, 2018
作者:  Ahmed, Bouraiou;  Necaibia, Ammar;  Mohammed, Mostefaoui;  Ziane, Abderrezzaq;  Nordine, Sahouane;  Dabou, Rachid
收藏  |  浏览/下载：25/0  |  提交时间：2019/12/09
PV module  degradation assessment  visual inspection  desert climate  EVA discoloration  
Degradation analysis of m-c-Si PV modules after long term exposure under desert climate 会议论文
会议名称: 20th International Middle East Power Systems Conference (MEPCON). 会议地点: Cairo, EGYPT. 会议日期: DEC 18-20, 2018
作者:  Ahmed, Bouraiou;  Necaibia, Ammar;  Mohammed, Mostefaoui;  Ziane, Abderrezzaq;  Nordine, Sahouane;  Dabou, Rachid
收藏  |  浏览/下载：15/0  |  提交时间：2019/12/09
PV module  degradation assessment  visual inspection  desert climate  EVA discoloration  
Experimental investigation of observed defects in crystalline silicon PV modules under outdoor hot dry climatic conditions in Algeria 期刊论文
发表期刊: SOLAR ENERGY. 出版年: 2018, 卷号: 159, 页码: 475-487
作者:  Bouraiou, Ahmed;  Hamouda, Messaoud;  Chaker, Abdelkader;  Necaibia, Ammar;  Mostefaoui, Mohammed;  Boutasseta, Nadir;  Ziane, Abderrezzaq;  Dabou, Rachid;  Sahouane, Nordine;  Lachtar, Salah
收藏  |  浏览/下载：16/0  |  提交时间：2019/11/29
Visual inspection of PV modules  PV defects  Mono-crystalline silicon  Poly-crystalline silicon  Performance assessment  
An Assessment of the Microbiological Water Quality of Sand Dams in Southeastern Kenya 期刊论文
发表期刊: WATER. 出版年: 2018, 卷号: 10, 期号: 6
作者:  Quinn, Ruth;  Avis, Orlando;  Decker, Manon;  Parker, Alison;  Cairncross, Sandy
收藏  |  浏览/下载：18/0  |  提交时间：2019/11/29
microbiology  faecal contamination  sand dam  sanitary inspection  
MTO-like reference mask modeling for advanced inverse lithography technology patterns 会议论文
会议名称: Photomask Japan 24th Symposium on Photomask and Next-Generation Lithography Mask Technology. 会议地点: Yokohama, JAPAN. 会议日期: APR 05-07, 2017
作者:  Park, Jongju;  Moon, Jongin;  Son, Suein;  Chung, Donghoon;  Kim, Byung-Gook;  Jeon, Chan-Uk;  LoPresti, Patrick;  Xue, Shan;  Wang, Sonny;  Broadbent, Bill;  Kim, Soonho;  Hur, Jiuk;  Choo, Min
收藏  |  浏览/下载：11/0  |  提交时间：2019/12/09
Photomask inspection  Pre-inspection data processing  OASIS  advanced ILT  
MTO-like reference mask modeling for advanced inverse lithography technology patterns 会议论文
会议名称: Photomask Japan 24th Symposium on Photomask and Next-Generation Lithography Mask Technology. 会议地点: Yokohama, JAPAN. 会议日期: APR 05-07, 2017
作者:  Park, Jongju;  Moon, Jongin;  Son, Suein;  Chung, Donghoon;  Kim, Byung-Gook;  Jeon, Chan-Uk;  LoPresti, Patrick;  Xue, Shan;  Wang, Sonny;  Broadbent, Bill;  Kim, Soonho;  Hur, Jiuk;  Choo, Min
收藏  |  浏览/下载：18/0  |  提交时间：2019/12/09
Photomask inspection  Pre-inspection data processing  OASIS  advanced ILT