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Identifying low reflection amplitude and low level phase noise points for permanent scatterer (PS) interferometry 会议论文
会议名称: IEEE International Conference on Microwaves, Communications, Antennas and Electronic Systems (COMCAS). 会议地点: Tel Aviv, ISRAEL. 会议日期: NOV 07-09, 2011
作者:  August, Yitzhak;  Blumberg, Dan G.;  Rotman, Stanley R.
收藏  |  浏览/下载:13/0  |  提交时间:2019/12/09
Calibration  Identifying Persistent Scatterers  Interferometry  InSAR  
Identifying low reflection amplitude and low level phase noise points for permanent scatterer (PS) interferometry 会议论文
会议名称: IEEE International Conference on Microwaves, Communications, Antennas and Electronic Systems (COMCAS). 会议地点: Tel Aviv, ISRAEL. 会议日期: NOV 07-09, 2011
作者:  August, Yitzhak;  Blumberg, Dan G.;  Rotman, Stanley R.
收藏  |  浏览/下载:17/0  |  提交时间:2019/12/09
Calibration  Identifying Persistent Scatterers  Interferometry  InSAR