中文版 | English

在结果中检索

Arid

浏览/检索结果: 共2条，第1-2条 帮助

已选(0)清除 条数/页：   排序方式：
Diagnostic-driven yield engineering under atypical wafer foundry conditions 期刊论文
发表期刊: MICROELECTRONICS RELIABILITY. 出版年: 2021, 卷号: 119
作者:  Ngow, Y. T.;  Goh, S. H.
收藏  |  浏览/下载：3/0  |  提交时间：2021/07/30
Root Cause Deconvolution (RCD)  Tessent Yield Insight (TYI)  Set of unique  Graphic Database System (GDS)  Open Artwork System Interchange Standard (OASIS)  Scan diagnosis  User-Defined Online Search (UDOS)  KDB (conversion of GDS information in to Avalon database)  Synopsys Avalon  
Automated nets extraction for digital logic physical failure analysis on IP-secure products 会议论文
会议名称: IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA). 会议地点: Singapore, SINGAPORE. 会议日期: JUL 20-23, 2020
作者:  Ngow, Y. T.;  Goh, S. H.;  Leo, J.;  Low, H. W.;  Kamoji, Rupa
收藏  |  浏览/下载：2/0  |  提交时间：2021/08/05
Graphic Database System (GDSII)  Open Artwork System Interchange Standard (OASIS)  Scan Diagnosis  User-Defined Online Search (UDOS)  Tool Command Language (TCL)  KDB (Conversion of GDSII information in to Synopsys Avalon Database)  KTMask Command (Program to send commands to the Synopsys Avalon MaskView tool)